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BiST model for IC RF-transceiver front-end.
Linköping University, The Institute of Technology. Linköping University, Department of Electrical Engineering, Electronic Devices.
2003 (English)In: IEEE Int. Symposium on Defect and Fault Tolerance in VLSI systems.,2003, Piscataway: IEEE Computer Society , 2003, 295- p.Conference paper, Published paper (Refereed)
Place, publisher, year, edition, pages
Piscataway: IEEE Computer Society , 2003. 295- p.
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Engineering and Technology
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URN: urn:nbn:se:liu:diva-34762Local ID: 23137OAI: oai:DiVA.org:liu-34762DiVA: diva2:255610
Available from: 2009-10-10 Created: 2009-10-10

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Dabrowski, Jerzy

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CiteExportLink to record
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Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
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  • Other style
More styles
Language
  • de-DE
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