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A process variation compensating technique for sub-90nm dynamic circuits.
Dept. of ECE Prudue University, UDS.
Dept. of ECE Purdue University, USA.
Linköping University, The Institute of Technology. Linköping University, Department of Electrical Engineering, Electronic Devices.
Intel Corp, Hillsboro, USA.
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2003 (English)In: Symposium on VLSI circuits.,2003, Tokyo: Business Center fo Academic Societies Japan , 2003, 205- p.Conference paper, Published paper (Refereed)
Place, publisher, year, edition, pages
Tokyo: Business Center fo Academic Societies Japan , 2003. 205- p.
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Engineering and Technology
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URN: urn:nbn:se:liu:diva-34778Local ID: 23200OAI: oai:DiVA.org:liu-34778DiVA: diva2:255626
Available from: 2009-10-10 Created: 2009-10-10

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Alvandpour, Atila

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