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Cycle-true leakage current modeling for CMOS gates.
Linköping University, The Institute of Technology. Linköping University, Department of Electrical Engineering, Electronic Devices.
Chalmers.
2001 (English)In: IEEE International Symposium on Circuits and Systems ISCAS,2001, Piscataway: IEEE , 2001, Vol. 5, 507-510 p.Conference paper, Published paper (Refereed)
Abstract [en]

This paper addresses cycle-true leakage current modeling for static CMOS gates. An approach to leakage power estimation is suggested which deals with some of the issues associated with the complex dynamic behavior of the gate. The paper discusses problems with defining gate leakage power. It then suggests a modeling approach, which separates the static leakage from the dynamic switch and short-circuit power. The model is used to achieve cycle-true leakage power estimation which is important as 20% of the power consumption in the designs of today can be leakage power. The importance of leakage power modeling will continue to grow as leakage power scales exponentially with reduced VT

Place, publisher, year, edition, pages
Piscataway: IEEE , 2001. Vol. 5, 507-510 p.
National Category
Engineering and Technology
Identifiers
URN: urn:nbn:se:liu:diva-34963DOI: 10.1109/ISCAS.2001.922096Local ID: 24310ISBN: 0-7803-6685-9 (print)OAI: oai:DiVA.org:liu-34963DiVA: diva2:255811
Conference
2001 IEEE International Symposium on Circuits and Systems, 06-09 May 2001, Sydney, NSW, Australia
Available from: 2009-10-10 Created: 2009-10-10 Last updated: 2015-06-17

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Eckerbert, Daniel

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  • apa
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