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High-Quality Low-Cost Test and DfT for an Embedded Asynchronous FIFO
Philips Research Labs.
Philips Research Labs.
Linköping University, The Institute of Technology. Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory.
Philips Research Labs.
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2006 (English)In: 14th Philips Research IC Test Seminar,2006, 2006Conference paper, Published paper (Other academic)
Place, publisher, year, edition, pages
2006.
Keyword [en]
testing, design for testability, embedded systems, FIFO
National Category
Computer Science
Identifiers
URN: urn:nbn:se:liu:diva-35456Local ID: 26909OAI: oai:DiVA.org:liu-35456DiVA: diva2:256304
Available from: 2009-10-10 Created: 2009-10-10

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Larsson, Erik

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CiteExportLink to record
Permanent link

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Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • oxford
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf