Combined Test Data Compression and Abort-on-Fail Test
2006 (English)In: 24th IEEE Norchip Conference,2006, Linköping: IEEE Computer Society Press , 2006Conference paper (Refereed)
The increasing test data volume needed for the testing of System-on-Chips (SOCs) leads to high Automatic Test Equipment (ATE) memory requirement and long test application times. Scheduling techniques where testing can be terminated as soon as a fault appears (abort-on-fail) as well as efficient compression schemes to reduce the ATE memory requirement have been proposed separately. Previous test data compression architectures often make use of Multiple Input Signature Response Analyzers (MISRs) for response compression. Therefore, abort-on-fail testing and diagnostic capabilities are limited. In this paper, we propose an SOC test architecture that (1) allows test data compression, (2) where clock cycle based as well as patternbased abort-on-fail testing are allowed and (3) diagnostic capabilities are not reduced. We have performed experiments on ISCAS designs.
Place, publisher, year, edition, pages
Linköping: IEEE Computer Society Press , 2006.
testing, test data, compression, abort-on-fail
IdentifiersURN: urn:nbn:se:liu:diva-35465Local ID: 26927OAI: oai:DiVA.org:liu-35465DiVA: diva2:256313