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Total Internal Reflection Ellipsometry: a tool for analysis of ultrathin films on metal surfaces
Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Applied Optics .ORCID iD: 0000-0001-9229-2028
Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Applied Optics .
2006 (English)In: 4th Workshop Ellipsometry,2006, 2006Conference paper, Published paper (Other academic)
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2006.
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Natural Sciences
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URN: urn:nbn:se:liu:diva-36156Local ID: 30265OAI: oai:DiVA.org:liu-36156DiVA: diva2:257004
Available from: 2009-10-10 Created: 2009-10-10 Last updated: 2013-10-14

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Arwin, HansPoksinski, Michal

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