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RF on-chip test by reconfiguration technique.
Linköping University, The Institute of Technology. Linköping University, Department of Electrical Engineering, Electronic Devices.
2006 (English)In: WSEAS International Conference.,2006, 2006Conference paper (Refereed)
Abstract [en]


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Engineering and Technology
URN: urn:nbn:se:liu:diva-37745Local ID: 38231OAI: diva2:258594
Available from: 2009-10-10 Created: 2009-10-10

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Dabrowski, Jerzy
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The Institute of TechnologyElectronic Devices
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