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Test Quality Analysis and Improvement for an Embedded Asynchronous FIFO
Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory. Linköping University, The Institute of Technology.
NXP Semiconductors Research, The Netherlands.
NXP Semiconductors Research, The Netherlands.
NXP Semiconductors Research, The Netherlands.
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2007 (English)In: Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE '07, Nice, France: IEEE , 2007, 859-864 p.Conference paper, Published paper (Refereed)
Abstract [en]

Embedded First-In First-Out (FIFO) memories are increasingly used in many IC designs. We have created a new full-custom embedded FIFO module with asynchronous read and write clocks, which is at least a factor two smaller and also faster than SRAM-based and standard-cell-based counterparts. The detection qualities of the FIFO test for both hard and weak resistive shorts and opens have been analyzed by an IFA-like method based on analog simulation. The defect coverage of the initial FIFO test for shorts in the bit-cell matrix has been improved by inclusion of an additional data background and low-voltage testing; for low-resistant shorts, 100% defect coverage is obtained. The defect coverage for opens has been improved by a new test procedure which includes waiting periods.

Place, publisher, year, edition, pages
Nice, France: IEEE , 2007. 859-864 p.
Series
Design, Automation, and Test in Europe Conference and Exhibition. Proceedings, ISSN 1530-1591
Keyword [en]
embedded systems, testing, FIFO, memory, test quality analysis
National Category
Computer Science
Identifiers
URN: urn:nbn:se:liu:diva-39308DOI: 10.1109/DATE.2007.364400ISI: 000252175700145Local ID: 47849ISBN: 978-3-9810801-2-4 (print)OAI: oai:DiVA.org:liu-39308DiVA: diva2:260157
Conference
Design, Automation and Test in Europe Conference and Exhibition (DATE 2007), 16-20 April 2007, Nice, France
Available from: 2009-10-10 Created: 2009-10-10 Last updated: 2012-11-16

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Larsson, Erik

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ESLAB - Embedded Systems LaboratoryThe Institute of Technology
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CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • oxford
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf