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Improved Scan Chain Diagnosis
NXP Semiconductors Research, The Netherlands.
Linköping University, The Institute of Technology. Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory.
Magma Design Automation, USA.
2007 (English)In: 15th NXP IC Test Symposium,2007, 2007Conference paper (Other academic)
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Computer Science
URN: urn:nbn:se:liu:diva-39309Local ID: 47850OAI: diva2:260158
Available from: 2009-10-10 Created: 2009-10-10

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Larsson, Erik
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The Institute of TechnologyESLAB - Embedded Systems Laboratory
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