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Nanoscale deep level defects correlation with Schottky barriers in 4H-SiC/Metal diodes
Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Materials Science .
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2006 (English)In: International Conference on Silicon Carbide and Related Materials 2005 ICSCRM 2005,2005, Materials Science Forum, V. 527-529: Trans Tech Publications , 2006, 907- p.Conference paper, Published paper (Refereed)
Place, publisher, year, edition, pages
Materials Science Forum, V. 527-529: Trans Tech Publications , 2006. 907- p.
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Natural Sciences
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URN: urn:nbn:se:liu:diva-39594Local ID: 50008OAI: oai:DiVA.org:liu-39594DiVA: diva2:260443
Available from: 2009-10-10 Created: 2009-10-10

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Wahab, Qamar Ul

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