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The impact of surface defects on SiC Schottky and ohmic contact formation
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2005 (English)In: International Semiconductor Device Research Symposium,2005, 2005Conference paper (Refereed)
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Natural Sciences
URN: urn:nbn:se:liu:diva-39809Local ID: 51336OAI: diva2:260658
Available from: 2009-10-10 Created: 2009-10-10

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Wahab, Qamar Ul
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The Institute of TechnologyMaterials Science
Natural Sciences

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