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Infrared ellipsometry characterization of conducting thin organic films
Inst for Experimental Physics II University of Leipzig.
Inst for Experimental Physics University of Leipzig.
JOANNEUM Research Forschungsgesellschaft mbH, Austria.
JOANNEUM Research Forschungsgesellschaft Mbh, Austria.
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2004 (English)In: Elsevier Science, ISSN 1626-3200, Vol. 455-456, 295-300 p.Article in journal (Refereed) Published
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2004. Vol. 455-456, 295-300 p.
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Natural Sciences
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URN: urn:nbn:se:liu:diva-41358DOI: 10.1016/j.tsf.2003.11.194Local ID: 55660OAI: oai:DiVA.org:liu-41358DiVA: diva2:262210
Available from: 2009-10-10 Created: 2009-10-10 Last updated: 2013-10-14

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Arwin, HansPersson, Nils-KristerZhang, FenglingInganäs, Olle

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