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Protein adsorption in porous silicon gradients monitored by spatially-resolved spectroscopic ellipsometry
Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Applied Optics.
Inst for Experimental Physics II University of Leipzig.
Inst for Experimental Physics II University of Leipzig.
Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Applied Optics.ORCID iD: 0000-0001-9229-2028
2004 (English)In: Elsevier Science, ISSN 1626-3200, Vol. 455-456, p. 726-730Article in journal (Refereed) Published
Abstract [en]

Porous silicon layers with a one-dimensional lateral gradient in pore size are prepared by electrochemical etching and characterized by spectroscopic ellipsometry in the visible to near-infrared region. The ellipsometer is equipped with a micro-spot option giving a lateral resolution of approximately 100 μm. By matching multiple-layer-model calculations to the laterally-resolved variable angle of incidence spectroscopic ellipsometry data, the thickness variation along the gradient as well as the in-depth porosity profile is mapped. Upon exposure to a protein solution, protein adsorption occurs on top of the porous silicon layer. At the high-porosity region of the gradient also penetration of protein molecules into the porous layer takes place. Ellipsometry data are recorded after protein exposure and variations of protein adsorption along the porous silicon gradient is modeled as well as the in-depth profile of protein penetration.

Place, publisher, year, edition, pages
2004. Vol. 455-456, p. 726-730
National Category
Natural Sciences
Identifiers
URN: urn:nbn:se:liu:diva-41362DOI: 10.1016/j.tsf.2004.01.062Local ID: 55664OAI: oai:DiVA.org:liu-41362DiVA, id: diva2:262214
Available from: 2009-10-10 Created: 2009-10-10 Last updated: 2018-03-09

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Karlsson, LindaArwin, Hans

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