Spectroscopic ellipsometry and vector network analysis for determination of the electromagnetic response in two wavelength regions
2008 (English)In: Physica Status Solidi. C: Current Topics in Solid State Physics, ISSN 1862-6351, Vol. 5, no 5, 1089-1092 p.Article in journal (Refereed) Published
In this work, spectroscopic ellipsometry and vector network analysis are used to determine the electromagnetic response of three samples, an epoxy polymer, a sample with ferrit-based nanoparticles in a polymer matrix and silicon, in the wavelength ranges 0.4-30 μm and 0.75-7.59 cm. Both methods measure amplitude and phase changes due to interaction with a sample and can be used to measure the full complex-valued dielectric response to electromagnetic radiation. The data from the two methods show similar levels of the response at the two ends of the spectral gap between the ranges of the two methods.
Place, publisher, year, edition, pages
Weinheim, Germany: Wiley-VCH Verlagsgesellschaft, 2008. Vol. 5, no 5, 1089-1092 p.
07.57.Pt; 07.60.Fs; 13.40.−f; 78.20.Ci; 81.70.Fy
IdentifiersURN: urn:nbn:se:liu:diva-42736DOI: 10.1002/pssc.200777900ISI: 000256862500021Local ID: 68463OAI: oai:DiVA.org:liu-42736DiVA: diva2:263593