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Spectroscopic ellipsometry and vector network analysis for determination of the electromagnetic response in two wavelength regions
Linköping University, Department of Physics, Chemistry and Biology, Applied Optics . Linköping University, The Institute of Technology. Department of Sensor Technology, Swedish Defense Research Agency, Linköping, Sweden.
Department of Sensor Technology, Swedish Defense Research Agency, Linköping, Sweden.
Department of Sensor Technology, Swedish Defense Research Agency, Linköping, Sweden.
Linköping University, Department of Physics, Chemistry and Biology, Applied Optics . Linköping University, The Institute of Technology.ORCID iD: 0000-0001-9229-2028
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2008 (English)In: Physica Status Solidi. C: Current Topics in Solid State Physics, ISSN 1862-6351, Vol. 5, no 5, 1089-1092 p.Article in journal (Refereed) Published
Abstract [en]

In this work, spectroscopic ellipsometry and vector network analysis are used to determine the electromagnetic response of three samples, an epoxy polymer, a sample with ferrit-based nanoparticles in a polymer matrix and silicon, in the wavelength ranges 0.4-30 μm and 0.75-7.59 cm. Both methods measure amplitude and phase changes due to interaction with a sample and can be used to measure the full complex-valued dielectric response to electromagnetic radiation. The data from the two methods show similar levels of the response at the two ends of the spectral gap between the ranges of the two methods.

Place, publisher, year, edition, pages
Weinheim, Germany: Wiley-VCH Verlagsgesellschaft, 2008. Vol. 5, no 5, 1089-1092 p.
Keyword [en]
07.57.Pt; 07.60.Fs; 13.40.−f; 78.20.Ci; 81.70.Fy
National Category
Natural Sciences
Identifiers
URN: urn:nbn:se:liu:diva-42736DOI: 10.1002/pssc.200777900ISI: 000256862500021Local ID: 68463OAI: oai:DiVA.org:liu-42736DiVA: diva2:263593
Available from: 2009-10-10 Created: 2009-10-10 Last updated: 2015-03-13Bibliographically approved
In thesis
1. Optical Studies of Materials for Spectral Design
Open this publication in new window or tab >>Optical Studies of Materials for Spectral Design
2015 (English)Licentiate thesis, comprehensive summary (Other academic)
Abstract [en]

Optical material properties have been studied in a wide wavelength range. Theaim is future use of spectral design for camou age. The main characterization techniques used in this work are Refection Spectroscopy, Scatterometry (BRDF) and Mueller Matrix Ellipsometry. Six camouflage evaluation criteria based on reflection, emissivity, polarization, gloss, dynamic coloring and broadband properties, are to a greater or lesser degree related to the interaction between light and materia. Almost all are connected to the work of this thesis and are exemplied through dierent material categories with potential for use in camouföage applications. The included papers presents: a broad band (visible-infrared-microwave) study, two examples of dynamic optical properties of thin lms, and polarization and scattering properties of a natural surface.

Place, publisher, year, edition, pages
Linköping: Linköping University Electronic Press, 2015. 29 p.
Series
Linköping Studies in Science and Technology. Thesis, ISSN 0280-7971 ; 1712
National Category
Physical Sciences
Identifiers
urn:nbn:se:liu:diva-115369 (URN)10.3384/lic.diva-115369 (DOI)978-91-7519-106-5 (ISBN)
Presentation
2015-04-10, Planck, Fysikhuset, Campus US, Linköpings universitet, Linköping, 10:15 (Swedish)
Opponent
Supervisors
Available from: 2015-03-13 Created: 2015-03-13 Last updated: 2016-06-28Bibliographically approved

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Åkerlind, ChristinaArwin, HansJärrendahl, Kenneth

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