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Core-Level Expansion of Compressed Test Patterns
Linköping University, The Institute of Technology. Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory.
Masters Programme in Computer Science Linköpings Universitet.
Linköping University, The Institute of Technology. Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory.
Dept. of Electrical and Computer Engineering Duke University, USA.
2008 (English)In: Proceedings of the Asian Test Symposium, Sapporo, JAPAN: IEEE Computer Society , 2008, 277-282 p.Conference paper, Published paper (Refereed)
Abstract [en]

 The increasing test-data volumes needed for the testing of system-on-chip (SOC) integrated circuits lead to long test-application times and high tester memory requirements. Efficient test planning and test-data compression are therefore needed. We present an analysis to highlight the fact that the impact of a test-data compression technique on test time and compression ratio are method-dependant as well as TAM-width dependant. This implies that for a given set of compression schemes, there is no compression scheme that is the optimal with respect to test time reduction and test-data compression at all TAM widths. We therefore propose a technique where we integrate core wrapper design, test architecture design and test scheduling with test-data compression technique selection for each core in order to minimize the SOC test-application time and the test-data volume. Experimental results for several SOCs crafted from industrial cores demonstrate that the proposed method leads to significant reduction in test-data volume and test time.

Place, publisher, year, edition, pages
Sapporo, JAPAN: IEEE Computer Society , 2008. 277-282 p.
Keyword [en]
integrated circuits, system-on-chip, testing, test-data compression, memory requirements, wrapper design, test-application time
National Category
Computer Science
Identifiers
URN: urn:nbn:se:liu:diva-43976DOI: 10.1109/ATS.2008.71Local ID: 75283ISBN: 978-0-7695-3396-4 (print)OAI: oai:DiVA.org:liu-43976DiVA: diva2:264837
Conference
17th Asian Test Symposium ATS,2008
Available from: 2009-10-10 Created: 2009-10-10 Last updated: 2014-06-02

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Publisher's full texthttp://www.ida.liu.se/labs/eslab/publications/pap/db/anlar_ats08.pdf

Authority records BETA

Larsson, AndersLarsson, Erik

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CiteExportLink to record
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Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • oxford
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
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  • asciidoc
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