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Dynamic Test Selection for Reconfigurable Diagnosis
2008 (English)In: Proceedings of the 47th IEEE Conference on Decision and Control, IEEE, 2008, 1066-1072Conference paper (Refereed)
Abstract [en]

Detecting and isolating multiple faults is a computationally intense task which typically consists of computing a set of tests, and then computing the diagnoses based on the test results. This paper proposes a method to reduce the computational burden by only running the tests that are currently needed, and dynamically starting new tests when the need changes. A main contribution is a method to select tests such that the computational burden is reduced while maintaining the isolation performance of the diagnostic system. Key components in the approach are the test selection algorithm, the test initialization procedures, and a knowledge processing framework that supports the functionality needed. The approach is exemplified on a relatively small dynamical system, which still illustrates the complexity and possible computational gain with the proposed approach.

IEEE Conference on Decision and Control. Proceedings, ISSN 0191-2216
Keyword [en]
Fault diagnosis, Knowledge based systems, Linear systems, Time-varying systems
National Category
Engineering and Technology Control Engineering
URN: urn:nbn:se:liu:diva-44264DOI: 10.1109/CDC.2008.4738793Local ID: 76139ISBN: 978-1-4244-3124-3ISBN: 978-1-4244-3123-6OAI: diva2:265126
47th IEEE Conference on Decision and Control, Cancun, Mexico, 9-11 December, 2008
Available from2009-10-10 Created:2009-10-10 Last updated:2014-01-31Bibliographically approved

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Krysander, MattiasHeintz, FredrikRoll, JacobFrisk, Erik
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