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Author:
Krysander, Mattias (Linköping University, Department of Electrical Engineering, Computer Engineering) (Linköping University, The Institute of Technology)
Heintz, Fredrik (Linköping University, Department of Computer and Information Science, Artificial Intelligence and Intergrated Computer systems) (Linköping University, The Institute of Technology)
Roll, Jacob (Linköping University, Department of Electrical Engineering, Automatic Control) (Linköping University, The Institute of Technology)
Frisk, Erik (Linköping University, Department of Electrical Engineering, Vehicular Systems) (Linköping University, The Institute of Technology)
Title:
Dynamic Test Selection for Reconfigurable Diagnosis
Department:
Linköping University, Department of Computer and Information Science, Artificial Intelligence and Intergrated Computer systems
Linköping University, Department of Electrical Engineering, Computer Engineering
Linköping University, Department of Electrical Engineering, Vehicular Systems
Linköping University, Department of Electrical Engineering, Automatic Control
Linköping University, The Institute of Technology
Publication type:
Conference paper (Refereed)
Language:
English
In:
Proceedings of the 47th IEEE Conference on Decision and Control
Conference:
47th IEEE Conference on Decision and Control, Cancun, Mexico, 9-11 December, 2008
Publisher: IEEE
Series:
IEEE Conference on Decision and Control. Proceedings, ISSN 0191-2216
Pages:
1066-1072
Year of publ.:
2008
URI:
urn:nbn:se:liu:diva-44264
Permanent link:
http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-44264
ISBN:
978-1-4244-3124-3, 978-1-4244-3123-6
Local ID:
76139
Subject category:
Engineering and Technology
Control Engineering
SVEP category:
TECHNOLOGY
Keywords(en) :
Fault diagnosis, Knowledge based systems, Linear systems, Time-varying systems
Abstract(en) :

Detecting and isolating multiple faults is a computationally intense task which typically consists of computing a set of tests, and then computing the diagnoses based on the test results. This paper proposes a method to reduce the computational burden by only running the tests that are currently needed, and dynamically starting new tests when the need changes. A main contribution is a method to select tests such that the computational burden is reduced while maintaining the isolation performance of the diagnostic system. Key components in the approach are the test selection algorithm, the test initialization procedures, and a knowledge processing framework that supports the functionality needed. The approach is exemplified on a relatively small dynamical system, which still illustrates the complexity and possible computational gain with the proposed approach.

Available from:
2009-10-10
Created:
2009-10-10
Last updated:
2014-01-31
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