Infrared ellipsometry and Raman studies of hexagonal InN films: Correlation between strain and vibrational properties
2004 (English)In: Superlattices and Microstructures, ISSN 0749-6036, Vol. 36, no 4-6, 573-580 p.Article in journal (Refereed) Published
The vibrational properties of InN films with different strain have been studied using Infrared ellipsometry and Raman scattering spectroscopy. We have established a correlation between the phonon mode parameters and the strain, which allows the determination of the deformation potentials and the strain-free frequencies of the InN E1(TO) and E2 modes. The LO phonons and their coupling to the free-carrier plasmon excitations are also discussed in relation to the carrier concentration in the films. © 2004 Elsevier Ltd. All rights reserved.
Place, publisher, year, edition, pages
2004. Vol. 36, no 4-6, 573-580 p.
Engineering and Technology
IdentifiersURN: urn:nbn:se:liu:diva-45612DOI: 10.1016/j.spmi.2004.09.014OAI: oai:DiVA.org:liu-45612DiVA: diva2:266508