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Ultraviolet photoelectron spectroscopy of polymers
Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Surface Physics and Chemistry .
Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Surface Physics and Chemistry .
Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Surface Physics and Chemistry .
Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Surface Physics and Chemistry .
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2006 (English)In: MOLECULAR CRYSTALS AND LIQUID CRYSTALS, ISSN 1542-1406, Vol. 455, 193-203 p.Article in journal (Refereed) Published
Abstract [en]

During the past three decades, ultraviolet photoelectron spectroscopy of polymer films has evolved from a sort of appearance-potential ( valence band edge) measurement, into a tool for studying the full valence band region of thin polymer films, including insulating polymers, semiconducting polymers and electrically conducting polymers. Progress may be loosely divided into several categories: (A) the melding of thin polymer film technology with ultra high vacuum technology and the widespread use of helium resonance lamps for studies of solid surfaces, (B) the combined approach of measurements and appropriate theoretical-computational methods, and (C) the advent of synchrotron radiation resulting in multi-photon spectroscopies, nominally in the area of the near UV. A coincident discovery of electrically conducting polymers, and especially the evolution of applications of semiconducting polymers, added technologically driven emphasis to this development of UPS for polymer materials. This contribution traces a limited number of highlights in the evolution of UPS of polymers, from the '70' s through to 2005.

Place, publisher, year, edition, pages
2006. Vol. 455, 193-203 p.
Keyword [en]
polymers, ultraviolet photoelectron spectroscopy, UPS
National Category
Engineering and Technology
Identifiers
URN: urn:nbn:se:liu:diva-45990DOI: 10.1080/15421400600698386OAI: oai:DiVA.org:liu-45990DiVA: diva2:266886
Available from: 2009-10-11 Created: 2009-10-11 Last updated: 2011-01-11

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de Jong, Michel PFriedlein, RainerOsikowicz, WojciechSalaneck, William RFahlman, Mats

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