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Contribution of dislocations to carrier recombination and transport in highly excited ELO and HYPE GaN layers
Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology.
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2006 (English)In: Physica status solidi. B, Basic research, ISSN 0370-1972, Vol. 243, no 7, 1426-1430 p.Article in journal (Refereed) Published
Abstract [en]

Nonequilibrium carrier dynamics has been investigated in ELO and HYPE grown GaN layers in a wide temperature and excitation range by using the time-resolved picosecond FWM technique. Carrier lifetime in the samples at 300 K increased up to 2.8-5.1 ns in accordance with the decreasing threading dislocation density from 4 x 10(7) cm(-2) (ELO) to mid 106 cm(-2) in HYPE layers. At T < 100 K, the hyperbolic shape of FWM kinetics indicated carrier density dependent radiative lifetimes, which gradually decreased at lower temperatures to a few hundreds of ps. The dominance of bimolecular recombination in HVPE layers at 10-40 K was demonstrated by the exposure characteristic of FWM, that has shown a sublinear growth of carrier density with excitation, N proportional to I-1/2. Numerical fitting of the set of FWM kinetics at various T confirmed the temperature dependence of bimolecular recombination coefficient B proportional to T-1/5 and provided its value B = 2 x 10(-11) cm(3)/s at 300 K and 3.2 x 10(-9) cm(3)/s at 9 K. The measured bipolar diffusion coefficients allowed determination of carrier diffusion length of 0.8-1 mu m at 300 K and its dependence on dislocation density and temperature. (c) WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Place, publisher, year, edition, pages
2006. Vol. 243, no 7, 1426-1430 p.
National Category
Engineering and Technology
URN: urn:nbn:se:liu:diva-46012DOI: 10.1002/pssb.200565139OAI: diva2:266908
Available from: 2009-10-11 Created: 2009-10-11 Last updated: 2011-01-11

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Gogova, DanielaMonemar, Bo
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