Assessment of phonon mode characteristics via infrared spectroscopic ellipsometry on a-plane GaN
2006 (English)In: Physica status solidi. B, Basic research, ISSN 0370-1972, Vol. 243, no 7, 1594-1598 p.Article in journal (Refereed) Published
Generalized infrared spectroscopic ellipsometry was applied to study the vibrational properties of anisotropically strained a-plane GaN films with different thicknesses. We have established a correlation between the phonon mode parameters and the strain, which allows the determination of the deformation potentials and strain-free frequency of the GaN A,(TO) mode. These results are compared with previous theoretical and experimental findings and discussed.
Place, publisher, year, edition, pages
2006. Vol. 243, no 7, 1594-1598 p.
Engineering and Technology
IdentifiersURN: urn:nbn:se:liu:diva-46014DOI: 10.1002/pssb.200565400OAI: oai:DiVA.org:liu-46014DiVA: diva2:266910