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Assessment of phonon mode characteristics via infrared spectroscopic ellipsometry on a-plane GaN
Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Materials Science .
Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology.
Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Materials Science .
Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Applied Optics .ORCID iD: 0000-0001-9229-2028
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2006 (English)In: Physica status solidi. B, Basic research, ISSN 0370-1972, E-ISSN 1521-3951, Vol. 243, no 7, 1594-1598 p.Article in journal (Refereed) Published
Abstract [en]

Generalized infrared spectroscopic ellipsometry was applied to study the vibrational properties of anisotropically strained a-plane GaN films with different thicknesses. We have established a correlation between the phonon mode parameters and the strain, which allows the determination of the deformation potentials and strain-free frequency of the GaN A,(TO) mode. These results are compared with previous theoretical and experimental findings and discussed.

Place, publisher, year, edition, pages
2006. Vol. 243, no 7, 1594-1598 p.
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Engineering and Technology
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URN: urn:nbn:se:liu:diva-46014DOI: 10.1002/pssb.200565400OAI: oai:DiVA.org:liu-46014DiVA: diva2:266910
Available from: 2009-10-11 Created: 2009-10-11 Last updated: 2017-12-13

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Darakchieva, VanyaPaskova, TanjaPaskov, PlamenArwin, HansMonemar, Bo

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Darakchieva, VanyaPaskova, TanjaPaskov, PlamenArwin, HansMonemar, Bo
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