Unsupervised scanning light pulse technique for chemical sensing
2004 (English)In: Sensors and actuators. B, Chemical, ISSN 0925-4005, Vol. 103, no 01-Feb, 225-232 p.Article in journal (Refereed) Published
A scanning light pulse technique (SLPT) operating in a totally unsupervised way suitable for chemical sensing and the efficient screening of new sensing materials is demonstrated. The procedure automatically determines inflexion points (optimum biasing condition) and photocurrent amplitudes from locally acquired i-V characteristics of metal-insulator-semiconductor structures that enables optimum biased measurements properly re-scaled to avoid spurious amplifying effects. Additionally, the procedure allows composing flat-band voltage shift patterns within the same experiment, and avoiding feedback mode measurements. Optimum bias patterns when used to modulate subsequent measurements, allow a fast recording mode. (C) 2004 Elsevier B.V. All rights reserved.
Place, publisher, year, edition, pages
2004. Vol. 103, no 01-Feb, 225-232 p.
scanning light pulse technique, chemical sensors, field effect sensors, MOS capacitors
Engineering and Technology
IdentifiersURN: urn:nbn:se:liu:diva-46176DOI: 10.1016/j.snb.2004.04.054OAI: oai:DiVA.org:liu-46176DiVA: diva2:267072