High-resolution Si2p core-level and low-energy electron diffraction studies of the Ca/Si(1 1 1)-(3 × 2) surface
2003 (English)In: Surface Science, ISSN 0039-6028, E-ISSN 1879-2758, Vol. 532-535, 628-632 p.Article in journal (Refereed) Published
We have investigated the surface structure of the Ca/Si(1 1 1)-(3 × 2) surface using low-energy electron diffraction (LEED) and high-resolution core-level photoelectron spectroscopy. Weak ×2 streaks were observed in LEED at 300 K. After cooling the sample to 100 K, ×2 spots, which originate from both (3 × 2) and c(6 × 2) periodicities, appeared. By considering the energy shift and intensity of each surface component observed in the Si2p core-level spectra, we conclude that the structure of the (3 × 2) surface is basically the same as that of the honeycomb-chain-channel model with a Ca coverage of 1/6 ML. Further, we propose that the weak ×2 streaks at 300 K result from thermally induced disorder. © 2003 Elsevier Science B.V. All rights reserved.
Place, publisher, year, edition, pages
2003. Vol. 532-535, 628-632 p.
Low energy electron diffraction (LEED), Photoelectron spectroscopy, Semiconducting surfaces, Silicon, Surface structure, morphology, roughness, and topography
Engineering and Technology
IdentifiersURN: urn:nbn:se:liu:diva-46595DOI: 10.1016/S0039-6028(03)00188-2OAI: oai:DiVA.org:liu-46595DiVA: diva2:267491