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Infrared dielectric functions and phonon modes of high-quality ZnO films
Universität Leipzig, Fak. F. Phys. and Geowissenschaften, Inst. F. Experimentelle Physik II, Linnéstrasse 5, 04103 Leipzig, Germany.
Universität Leipzig, Fak. F. Phys. and Geowissenschaften, Inst. F. Experimentelle Physik II, Linnéstrasse 5, 04103 Leipzig, Germany.
Universität Leipzig, Fak. F. Phys. and Geowissenschaften, Inst. F. Experimentelle Physik II, Linnéstrasse 5, 04103 Leipzig, Germany.
Universität Leipzig, Fak. F. Phys. and Geowissenschaften, Inst. F. Experimentelle Physik II, Linnéstrasse 5, 04103 Leipzig, Germany.
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2003 (English)In: Journal of Applied Physics, ISSN 0021-8979, Vol. 93, no 1, 126-133 p.Article in journal (Refereed) Published
Abstract [en]

A study was performed on the phonon modes and infrared dielectric functions of high-quality ZnO thin films. The pulsed laser deposition technique was used to deposit the ZnO films on c-plane sapphire substrates and were investigated by high-resolution transmission electron microscopy, high-resolution x-ray diffraction and Rutherford backscattering experiments. The accurate long-wavelength dielectric constant limits of the films were also obtained and were compared with near-band-gap index-of-refraction data upon the Lyddane-Sachs-Teller relation for both film and bulk samples. It was found that the phonon modes of the film were highly consistent with those of the bulk sample.

Place, publisher, year, edition, pages
2003. Vol. 93, no 1, 126-133 p.
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Engineering and Technology
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URN: urn:nbn:se:liu:diva-46764DOI: 10.1063/1.1526935OAI: oai:DiVA.org:liu-46764DiVA: diva2:267660
Available from: 2009-10-11 Created: 2009-10-11 Last updated: 2013-10-14

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Darakchieva, VanyaArwin, HansMonemar, Bo

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