The determination of thickness and surface mass density of mesothick immunoprecipitate layers by null ellipsometry and protein 125Iodine labeling
2002 (English)In: Journal of Colloid and Interface Science, ISSN 0021-9797, Vol. 249, no 1, 84-90 p.Article in journal (Refereed) Published
The aim of the present study was to ellipsometrically determine the thickness and surface mass density in air for up to 110-nm-thick organic layers made of alternatingly deposited layers of HSA and polyclonal anti-HSA on hydrophobic silicon. The ellipsometrically determined thickness was compared to that obtained by AFM and the deposited surface mass density calibrated with 125I-labeled proteins. The results indicate a good agreement in protein layer thickness between AFM and ellipsometry when the protein film refractive index Nfilm = 1.5 -0i, although then the calculated surface mass density from the ellipsometry data became grossly overestimated by the Cuypers one-component formula. A good agreement in the surface mass density was obtained when the M/A ratio in this formula was lowered from 4.14 to 2.35. This approach indicates a convenient means of determining the refractive indices and surface mass densities of mesothick organic layers proteins on solid supports. © 2002 Elsevier Science (USA).
Place, publisher, year, edition, pages
2002. Vol. 249, no 1, 84-90 p.
Ellipsometry, Mass, Protein adsorption, Radio labeling, Thickness
Engineering and Technology
IdentifiersURN: urn:nbn:se:liu:diva-46903DOI: 10.1006/jcis.2002.8247OAI: oai:DiVA.org:liu-46903DiVA: diva2:267799