From defect reduction to reduction of waste and customer/stakeholder satisfaction (understanding the new TQM metrology)
2002 (English)In: Total quality management (Print), ISSN 0954-4127, Vol. 13, no 8, 1069-1085 p.Article in journal (Refereed) Published
With the evolution of quality from inspection and defect reduction to the new management philosophy, TQM, a new quality metrology is needed. Contributions to building the new TQM Metrology in the form of principles, guidelines and examples are presented and discussed.
Place, publisher, year, edition, pages
2002. Vol. 13, no 8, 1069-1085 p.
Engineering and Technology
IdentifiersURN: urn:nbn:se:liu:diva-47828DOI: 10.1080/0954412022000024717OAI: oai:DiVA.org:liu-47828DiVA: diva2:268724