Spin polarized La0.7Sr0.3MnO3 thin films on silicon
2007 (English)In: Journal of Magnetism and Magnetic Materials, ISSN 0304-8853, Vol. 312, no 2, 453-457 p.Article in journal (Refereed) Published
La0.7Sr0.3MnO3 polycrystalline manganite thin films were grown on silicon (Si) substrates covered by SiOx amorphous native oxide. Curie temperatures of about 325 K were achieved for 70-nm-thick films. Strong room temperature XMCD signal was detected indicating high spin polarization at the surface. Cross-sectional TEM images show sharp interface between SiOx and manganite without signature of chemical reaction at the interface. Unusual sharp splitting of the manganite film was observed: on the top of a transition layer characterized by low crystalline order, a magnetically robust layer is formed. © 2007 Elsevier B.V. All rights reserved.
Place, publisher, year, edition, pages
2007. Vol. 312, no 2, 453-457 p.
Interface, Manganite, Spintronics
Engineering and Technology
IdentifiersURN: urn:nbn:se:liu:diva-47955DOI: 10.1016/j.jmmm.2006.11.221OAI: oai:DiVA.org:liu-47955DiVA: diva2:268851