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Microwave-induced delocalization of excitons in ternary compounds of II-VI and III-V semiconductors
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2003 (English)In: Acta Physica Polonica. A, ISSN 0587-4246, E-ISSN 1898-794X, Vol. 103, no 6, p. 559-566Article in journal (Refereed) Published
Abstract [en]

In this work we employ technique of optically detected cyclotron resonance for evaluation of the role of localization processes in CdTe/CdMnTe and CdMnTe/CdMgTe quantum well structures. From microwave-induced changes of excitonic emissions we evaluate magnitude of potential fluctuations (Stokes shift), correlate optically detected cyclotron resonance results with the results of time-resolved experiments and discuss nature of recombination processes in the limit of a strong localization.

Place, publisher, year, edition, pages
2003. Vol. 103, no 6, p. 559-566
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Engineering and Technology
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URN: urn:nbn:se:liu:diva-48594OAI: oai:DiVA.org:liu-48594DiVA, id: diva2:269490
Available from: 2009-10-11 Created: 2009-10-11 Last updated: 2017-12-12

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Monemar, BoZhuravlev, Konstantin

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The Institute of TechnologyMaterials Science Department of Physics, Chemistry and Biology
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