X-ray photoelectron spectroscopy study of the metal/polymer contacts involving aluminum and poly(3,4-ethylenedioxythiophene)-poly(styrenesulfonic acid) derivatives
2003 (English)In: Journal of Materials Research, ISSN 0884-2914, Vol. 18, no 5, 1219-1226 p.Article in journal (Refereed) Published
The contact formed between aluminum and poly(3,4-ethylenedioxythiophene)-poly(styrenesulfonic acid) (PEDOT-PSS) derivatives was studied using x-ray photoelectron spectroscopy. The aluminum/PEDOT-PSS contact contains an interfacial layer formed by chemical reactions between aluminum and mainly poly(styrenesulfonic acid) (PSSH). These chemical interactions were studied with the help of model systems (PSSH, benzenesulfonic acid, and sodium benzenesulfonate). The preferred reaction site of aluminum is the SO3− and SO3−H+ groups of the PSS chains, giving rise to C-S-Al(-O) and C-O-Al species. The resulting contact formed consists of an insulating aluminum/PSS layer and a thin region of partially dedoped PEDOT-PSS. There is significant aluminum diffusion into films of the highly conducting form of PEDOT-PSS that have substantially less PSS at the surface. Hence, no (thick) aluminum/PSS layer is formed in this case, though the PEDOT chains close to the aluminum contact will still be partially dedoped as for the aluminum/PEDOT-PSS case.
Place, publisher, year, edition, pages
2003. Vol. 18, no 5, 1219-1226 p.
Engineering and Technology
IdentifiersURN: urn:nbn:se:liu:diva-48652DOI: 10.1557/JMR.2003.0167OAI: oai:DiVA.org:liu-48652DiVA: diva2:269548