liu.seSearch for publications in DiVA
Change search
ReferencesLink to record
Permanent link

Direct link
Spectroscopic ellipsometry for characterization and monitoring of organic layers
Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Applied Optics .ORCID iD: 0000-0001-9229-2028
2001 (English)In: Physica status solidi. A, Applied research, ISSN 0031-8965, Vol. 188, no 4, 1331-1338 p.Article in journal (Refereed) Published
Abstract [en]

The thickness resolution and the in situ advantage of ellipsometry make this optical technique suitable for studies of thin organic layers, especially those of biological interest. With state of the art methodology it is possible to perform monolayer spectroscopy, e.g. of a protein layer at a solid/ liquid interface and also to resolve details in the kinetics of layer formation. Furthermore, complicated microstructures, like porous silicon layers, can be characterized and protein adsorption can be monitored in porous layers providing information about pore filling and penetration depths of protein molecules of different size and type. Quantification of adsorption and determination of microstructural parameters of thin organic layers on planar surfaces and in porous layers are of large interest in areas like biomaterials, basic studies of surface-based biointeraction and for biosensor development. In this report we review the use of spectroscopic ellipsometry for studies of organic layers including protein adsorption and protein monolayer spectroscopy. Included is also a discussion about possibilities for in situ spectroscopic monitoring of engineering of multilayer systems based on macromolecules.

Place, publisher, year, edition, pages
2001. Vol. 188, no 4, 1331-1338 p.
National Category
Engineering and Technology
URN: urn:nbn:se:liu:diva-49015OAI: diva2:269911
Available from: 2009-10-11 Created: 2009-10-11 Last updated: 2013-10-14

Open Access in DiVA

No full text

Search in DiVA

By author/editor
Arwin, Hans
By organisation
The Institute of TechnologyApplied Optics
In the same journal
Physica status solidi. A, Applied research
Engineering and Technology

Search outside of DiVA

GoogleGoogle Scholar
The number of downloads is the sum of all downloads of full texts. It may include eg previous versions that are now no longer available

Total: 26 hits
ReferencesLink to record
Permanent link

Direct link