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Modification of the structure of ZnO : Al films by control of the plasma parameters
Bulgarian Acad Sci, Cent Lab Solar Energy & New Energy Sources, Sofia 1784, Bulgaria Bulgarian Acad Sci, Inst Solid State Phys, Sofia 1784, Bulgaria Univ Roma La Sapienza, I-00161 Rome, Italy INFM, Unita Roma 1, I-00161 Rome, Italy Linkoping Univ, IFM, FYSIKHUSET, S-58183 Linkoping, Sweden.
Bulgarian Acad Sci, Cent Lab Solar Energy & New Energy Sources, Sofia 1784, Bulgaria Bulgarian Acad Sci, Inst Solid State Phys, Sofia 1784, Bulgaria Univ Roma La Sapienza, I-00161 Rome, Italy INFM, Unita Roma 1, I-00161 Rome, Italy Linkoping Univ, IFM, FYSIKHUSET, S-58183 Linkoping, Sweden.
Bulgarian Acad Sci, Cent Lab Solar Energy & New Energy Sources, Sofia 1784, Bulgaria Bulgarian Acad Sci, Inst Solid State Phys, Sofia 1784, Bulgaria Univ Roma La Sapienza, I-00161 Rome, Italy INFM, Unita Roma 1, I-00161 Rome, Italy Linkoping Univ, IFM, FYSIKHUSET, S-58183 Linkoping, Sweden.
Bulgarian Acad Sci, Cent Lab Solar Energy & New Energy Sources, Sofia 1784, Bulgaria Bulgarian Acad Sci, Inst Solid State Phys, Sofia 1784, Bulgaria Univ Roma La Sapienza, I-00161 Rome, Italy INFM, Unita Roma 1, I-00161 Rome, Italy Linkoping Univ, IFM, FYSIKHUSET, S-58183 Linkoping, Sweden.
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2001 (English)In: Thin Solid Films, ISSN 0040-6090, E-ISSN 1879-2731, Vol. 396, no 1-2, 274-279 p.Article in journal (Refereed) Published
Abstract [en]

ZnO:Al films were deposited by RF magnetron sputtering in triode configuration applying an external DC electric field to the substrates. Reflection high-energy electron diffraction measurements characterized the different films as consisting of randomly-oriented zinc blende crystallites or randomly and texture-oriented wurtzite crystallites, as well as of the amorphous phase. The non-resonant Raman spectra are strongly influenced by the presence of a built-in electric field at the grain boundaries and they do not depend on the symmetry of the microcrystallites. The Raman spectra taken at resonant excitation are more sensitive to the presence of the amorphous phase in the films. (C) 2001 Elsevier Science B.V. All rights reserved.

Place, publisher, year, edition, pages
2001. Vol. 396, no 1-2, 274-279 p.
Keyword [en]
sputtering, zinc oxide, Raman scattering, high energy electron diffraction (RHEED)
National Category
Engineering and Technology
Identifiers
URN: urn:nbn:se:liu:diva-49093OAI: oai:DiVA.org:liu-49093DiVA: diva2:269989
Available from: 2009-10-11 Created: 2009-10-11 Last updated: 2017-12-12

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Ivanov, Ivan Gueorguiev

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