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Progress in scanning probe microscopy: High resolution force microscopy and spectroscopy
Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Applied Physics .
Linkoping Univ, Dept Phys & Measurement Technol, Appl Phys Lab, S-58183 Linkoping, Sweden Chalmers Univ Technol, Dept Appl Phys, S-41296 Gothenburg, Sweden Univ Gothenburg, S-41296 Gothenburg, Sweden.
2000 (English)In: Current Science, ISSN 0011-3891, Vol. 78, no 12, 1445-1457 p.Article in journal (Refereed) Published
Abstract [en]

During the last few years the Atomic Force Microscope (AFM) has become capable of routinely obtaining atomic resolution when operated with a vibrating cantilever (ac-mode). Local measurement of the tip-sample force (force spectroscopy) is a powerful tool for investigations of contact phenomena at the atomic scale that are important in fields like friction, tribology, atom manipulation and chemical bond formation. This paper reviews several aspects of the AFM technique such as tip-surface forces, force sensors, operation modes and contrast effects. A study of the Si(111)7 x 7 reconstruction is presented as an example of high resolution AFM imaging.

Place, publisher, year, edition, pages
2000. Vol. 78, no 12, 1445-1457 p.
National Category
Engineering and Technology
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URN: urn:nbn:se:liu:diva-49679OAI: oai:DiVA.org:liu-49679DiVA: diva2:270575
Available from: 2009-10-11 Created: 2009-10-11 Last updated: 2011-01-14

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Erlandsson, Ragnar

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