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Measurement of micrometer diffusion lengths by nuclear spectrometry
Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. Petersburg, 194021, Russian Federation.
Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. Petersburg, 194021, Russian Federation.
Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. Petersburg, 194021, Russian Federation.
Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Materials Science .
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2005 (English)In: Semiconductors (Woodbury, N.Y.), ISSN 1063-7826, E-ISSN 1090-6479, Vol. 39, no 12, 1394-1398 p.Article in journal (Refereed) Published
Abstract [en]

A method for determination of diffusion lengths in the range 0.5-50 µm, which corresponds to carrier lifetimes in the nanosecond range, is suggested A calibrated nonequilibrium charge is injected into the base of the reverse-biased diode structure. The injection is provided by alpha particles generated by natural decay in the single-particle counting mode. The nuclear spectrometry technique is used to measure the amount of charge that diffused across the base to the boundary of the electric-field region. The loss of charge during the diffusion is calculated as a function of the depth of alpha particle penetration beyond the electric-field region. The derived power-law functions make it possible to relate the diffusion length with the exponent and numerical factor that describes the loss of charge. The experiment is performed with lightly doped 4H-SiC epitaxial films. © 2005 Pleiades Publishing, Inc.

Place, publisher, year, edition, pages
2005. Vol. 39, no 12, 1394-1398 p.
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Engineering and Technology
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URN: urn:nbn:se:liu:diva-50336DOI: 10.1134/1.2140311OAI: oai:DiVA.org:liu-50336DiVA: diva2:271232
Available from: 2009-10-11 Created: 2009-10-11 Last updated: 2017-12-12

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Syväjärvi, MikaelYakimova, Rositsa

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