Structural and magnetic properties of thin manganite films grown on silicon substrates
2005 (English)In: Progress in Solid State Chemistry, ISSN 0079-6786, Vol. 33, no 2-4 SPEC. ISS., 293-298 p.Article in journal (Refereed) Published
Polycrystalline La0.7Sr0.3MnO3 manganite thin films were grown on silicon substrates covered by SiOx amorphous native oxide. Unusual splitting of the manganite layer was found: on the top of an intermediate layer characterised by lower crystalline order, a magnetic robust layer is formed. Curie temperatures of about 325 K were achieved for 70 nm thick films. A strong room temperature XMCD signal was detected indicating high spin polarisation near the surface. © 2005 Elsevier Ltd. All rights reserved.
Place, publisher, year, edition, pages
2005. Vol. 33, no 2-4 SPEC. ISS., 293-298 p.
Engineering and Technology
IdentifiersURN: urn:nbn:se:liu:diva-50366DOI: 10.1016/j.progsolidstchem.2005.11.004OAI: oai:DiVA.org:liu-50366DiVA: diva2:271262