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Study of luminescent centers in ZnO nanorods catalytically grown on 4H-p-SiC
Linköping University, Department of Science and Technology. Linköping University, The Institute of Technology.
Linköping University, Department of Science and Technology. Linköping University, The Institute of Technology.
Linköping University, Department of Science and Technology. Linköping University, The Institute of Technology.
Linköping University, Department of Science and Technology. Linköping University, The Institute of Technology.ORCID iD: 0000-0001-6235-7038
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2009 (English)In: Semiconductor Science and Technology, ISSN 0268-1242, E-ISSN 1361-6641, Vol. 24, no 12, 125015- p.Article in journal (Refereed) Published
Abstract [en]

High-quality ZnO nanorods (NRs) were grown by the vapor-liquid-solid (VLS) technique on 4H-p-SiC substrates. Heterojunction light emitting diodes (LEDs) were fabricated. Electrical characterization including deep level transient spectroscopy (DLTS) complemented by photoluminescence (PL) is used to characterize the heterojunction LEDs. In contrast to previously published results on n-ZnO thin films on p-SiC, we found that the dominant emission is originating from the ZnO NRs. Three luminescence lines have been observed; these are associated with blue (465 nm) and violet (446 nm) emission lines from ZnO NRs emitted by direct transition/recombination of carriers from the conduction band to a zinc vacancy (V-Zn) radiative center and from a zinc interstitial (Zn-i) radiative center to the valance band. The third green-yellow (575 nm) spectral line is emitted due to a transition of carriers from Zn-i to V-Zn. The superposition of these lines led to the observation of strong white light which appears as a wide band in the room temperature PL.

Place, publisher, year, edition, pages
2009. Vol. 24, no 12, 125015- p.
National Category
Natural Sciences
Identifiers
URN: urn:nbn:se:liu:diva-52416DOI: 10.1088/0268-1242/24/12/125015OAI: oai:DiVA.org:liu-52416DiVA: diva2:285072
Note
Original Publication: Nargis Bano, I Hussain, Omer Nour, Magnus Willander, P Klason and Anne Henry, Study of luminescent centers in ZnO nanorods catalytically grown on 4H-p-SiC, 2009, SEMICONDUCTOR SCIENCE AND TECHNOLOGY, (24), 12, 125015. http://dx.doi.org/10.1088/0268-1242/24/12/125015 Copyright: Iop Publishing Ltd http://www.iop.org/ Available from: 2010-01-11 Created: 2009-12-18 Last updated: 2017-12-12Bibliographically approved
In thesis
1. Fabrication and Characterization of ZnO Nanorods Based Intrinsic White Light Emitting Diodes (LEDs)
Open this publication in new window or tab >>Fabrication and Characterization of ZnO Nanorods Based Intrinsic White Light Emitting Diodes (LEDs)
2011 (English)Doctoral thesis, comprehensive summary (Other academic)
Abstract [en]

ZnO material based hetero-junctions are a potential candidate for the design andrealization of intrinsic white light emitting devices (WLEDs) due to several advantages overthe nitride based material system. During the last few years the lack of a reliable andreproducible p-type doping in ZnO material with sufficiently high conductivity and carrierconcentration has initiated an alternative approach to grow n-ZnO nanorods (NRs) on other ptypeinorganic and organic substrates. This thesis deals with ZnO NRs-hetero-junctions basedintrinsic WLEDs grown on p-SiC, n-SiC and p-type polymers. The NRs were grown by thelow temperature aqueous chemical growth (ACG) and the high temperature vapor liquid solid(VLS) method. The structural, electrical and optical properties of these WLEDs wereinvestigated and analyzed by means of scanning electron microscope (SEM), current voltage(I-V), photoluminescence (PL), cathodoluminescence (CL), electroluminescence (EL) anddeep level transient spectroscopy (DLTS). Room temperature (RT) PL spectra of ZnOtypically exhibit one sharp UV peak and possibly one or two broad deep level emissions(DLE) due to deep level defects in the bandgap. For obtaining detailed information about thephysical origin, growth dependence of optically active defects and their spatial distribution,especially to study the re-absorption of the UV in hetero-junction WLEDs structure depthresolved CL spectroscopy, is performed. At room temperature the CL intensity of the DLEband is increased with the increase of the electron beam penetration depth due to the increaseof the defect concentration at the ZnO NRs/substrate interface. The intensity ratio of the DLEto the UV emission, which is very useful in exploring the origin of the deep level emissionand the distribution of the recombination centers, is monitored. It was found that the deepcenters are distributed exponentially along the ZnO NRs and that there are more deep defectsat the root of ZnO NRs compared to the upper part. The RT-EL spectra of WLEDs illustrateemission band covering the whole visible range from 420 nm and up to 800 nm. The whitelightcomponents are distinguished using a Gaussian function and the components were foundto be violet, blue, green, orange and red emission lines. The origin of these emission lines wasfurther identified. Color coordinates measurement of the WLEDs reveals that the emitted lighthas a white impression. The color rendering index (CRI) and the correlated color temperature(CCT) of the fabricated WLEDs were calculated to be 80-92 and 3300-4200 K, respectively.

Place, publisher, year, edition, pages
Linköping: Linköping University Electronic Press, 2011. 68 p.
Series
Linköping Studies in Science and Technology. Dissertations, ISSN 0345-7524 ; 1401
Keyword
Zinc Oxide nanorods, White light emitting diode, Photoluminescence, Cathodoluminescence, Electroluminescence, Deep level transient spectroscopy (DLTS)
National Category
Engineering and Technology
Identifiers
urn:nbn:se:liu:diva-71829 (URN)978-91-7393-054-3 (ISBN)
Public defence
2011-11-11, K3, Kåkenhus, Campus Norrköping, Linköpings universitet, Norrköping, 10:15 (English)
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Available from: 2011-11-07 Created: 2011-11-07 Last updated: 2014-01-15Bibliographically approved

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Bano, NargisHussain Ibupoto, ZafarNour, OmerWillander, MagnusHenry, Anne

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