Compontent Tolerance Effect on Ultra-Wideband Low-Noise Amplifier Performance
2010 (English)In: IEEE Transactions on Advanced Packaging, ISSN 1521-3323, E-ISSN 1557-9980, Vol. 33, no 3, 660-668 p.Article in journal (Refereed) Published
A study of the component tolerances on an ultra-wideband low-noise amplifier designed on a conventional printed circuit board is presented in this paper. The low-noise amplifier design employs dual-section input and output microstrip matching networks for wideband operation with a low noise figure and a flat power gain. Firstly, the effect of passive component and manufacturing process tolerances on the low-noise amplifier performance is theoretically studied by means of sensitivity analyses. Secondly, simulation and measurement results are presented for verification of the analytical results. It is shown that, compared with a lumped matching network design, a microstrip matching network design significantly reduces the ultra-wideband low-noise amplifier sensitivity to component tolerances.
Place, publisher, year, edition, pages
IEEE , 2010. Vol. 33, no 3, 660-668 p.
Low-noise amplifier, matching networks, sensitivity analysis, ultrawideband, UWB
IdentifiersURN: urn:nbn:se:liu:diva-53604DOI: 10.1109/TADVP.2010.2041348ISI: 000286011100010OAI: oai:DiVA.org:liu-53604DiVA: diva2:290139
©2011 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. Adriana Serban, Magnus Karlsson and Shaofang Gong, Compontent Tolerance Effect on Ultra-Wideband Low-Noise Amplifier Performance, 2011, IEEE Transactions on Advanced Packaging, (33), 3, 660-668. http://dx.doi.org/10.1109/TADVP.2010.20413482010-01-262010-01-262016-01-07Bibliographically approved