Photonic crystals with lattice constant in the visible range of light can be fabricated using freestanding carbon nanofibres. These types of structures are optically complicated, with geometric effects both from the lattice and from individual scatterers. In this report, results from pilot studies of the optical properties of such samples are presented.
Ellipsometric measurements on samples with vertically aligned arrays of free-standing carbon nanofibres with lengths up to 1600 nm are presented. The carbon nanofibres were grown on silicon wafers with a 70 nm layer of titanium and a 15 nm layer of titanium nitride using plasma-CVD with nickel as catalyst. Electron beam lithography was used to create the nanofibre lattice. Samples with varying periodicity and length of the carbon fibers, i.e. film thickness, were investigated.
In this pilot study measurements were performed with a dual rotating compensator ellipsometer in the spectral range 245-1700 nm. The instrument provides the full Mueller matrix of the sample and measurements were performed at multiple angles of incidence and different sample orientations.
The samples show no difference in the optical response when rotated 90°, but at other orientations changes in the spectrum are observed below a wavelength of approximately 1000 nm. The analysis of the ellipsometric data is presented and different modeling approaches are discussed.
AVS 56th Int. Symp. & Exhibition, San Jose, CA, USA, November 8-13, 2009