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A burn-in tolerant dynamic circuit technique
Linköping University, Department of Electrical Engineering, Electronic Devices. Linköping University, The Institute of Technology.
Intel Corporation, Hillsboro, USA.
Intel Corporation, Hillsboro, USA.
Intel Corporation, Hillsboro, USA.
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2002 (English)In: Proceedings of the IEEE Custom Integrated Circuits Conference, 2002, 81-84 p.Conference paper, Published paper (Refereed)
Place, publisher, year, edition, pages
2002. 81-84 p.
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Engineering and Technology
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URN: urn:nbn:se:liu:diva-53995OAI: oai:DiVA.org:liu-53995DiVA: diva2:296793
Conference
IEEE Custom Integrated Circuits Conference, May 12-15, 2002, Orlando, Florida, USA
Available from: 2010-02-18 Created: 2010-02-18 Last updated: 2013-01-15

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Alvandpour, Atila

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CiteExportLink to record
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