Electronic structure investigation of MAX-phases by soft x-ray emission spectroscopy
2007 (English)In: MRS Online Proceedings Library, Volume 1023 / [ed] E. Ivers-Tiffee and S. Barnett, 2007Conference paper (Refereed)
The electronic structure of nanolaminate Ti2AlC and Ti2AlN thin films, so-called MAX-phases, were investigated by soft X-ray emission spectroscopy. These nanolaminated carbide and nitride compounds represent a class of layered materials with a combination of properties from both metals and ceramics. The bulk-sensitive soft X-ray emission technique is particularly useful for detecting detailed electronic structure information about internal monolayers and interfaces. The Ti-Al bonding is manifested by a pronounced peak in the Ti L-emission of Ti2AlC and Ti2AlN that is not present in the binary TiC system. The spectral shape of Al L-emission in the MAX-phase is strongly modified in comparison to metallic Al. By replacing or partly exchanging C with N, a change of the electron population can be achieved causing a change of covalent bonding between the laminated layers, which enables control of the material properties.
Place, publisher, year, edition, pages
, Materials Research Society (MRS) proceedings 2007, Vol. 1023
National CategoryCondensed Matter Physics
IdentifiersURN: urn:nbn:se:liu:diva-55064DOI: 10.1557/PROC-1023-JJ09-01OAI: oai:DiVA.org:liu-55064DiVA: diva2:315274
MRS Spring Meeting, Symposium JJ – Functional Nanoscale Ceramics for Energy Systems, April 9-13, San Francisco, California, USA