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Electronic structure investigation of MAX-phases by soft x-ray emission spectroscopy
Department of Physics, Uppsala University.ORCID iD: 0000-0002-0317-0190
2007 (English)In: MRS Online Proceedings Library, Volume 1023 / [ed] E. Ivers-Tiffee and S. Barnett, 2007Conference paper, Published paper (Refereed)
Abstract [en]

The electronic structure of nanolaminate Ti2AlC and Ti2AlN thin films, so-called MAX-phases, were investigated by soft X-ray emission spectroscopy. These nanolaminated carbide and nitride compounds represent a class of layered materials with a combination of properties from both metals and ceramics. The bulk-sensitive soft X-ray emission technique is particularly useful for detecting detailed electronic structure information about internal monolayers and interfaces. The Ti-Al bonding is manifested by a pronounced peak in the Ti L-emission of Ti2AlC and Ti2AlN that is not present in the binary TiC system. The spectral shape of Al L-emission in the MAX-phase is strongly modified in comparison to metallic Al. By replacing or partly exchanging C with N, a change of the electron population can be achieved causing a change of covalent bonding between the laminated layers, which enables control of the material properties.

Place, publisher, year, edition, pages
2007.
Series
Materials Research Society (MRS) proceedings 2007, Vol. 1023
National Category
Condensed Matter Physics
Identifiers
URN: urn:nbn:se:liu:diva-55064DOI: 10.1557/PROC-1023-JJ09-01OAI: oai:DiVA.org:liu-55064DiVA: diva2:315274
Conference
MRS Spring Meeting, Symposium JJ – Functional Nanoscale Ceramics for Energy Systems, April 9-13, San Francisco, California, USA
Available from: 2010-04-28 Created: 2010-04-28 Last updated: 2014-11-26Bibliographically approved

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Magnuson, Martin

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Citation style
  • apa
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