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Max-Phases Investigated by Soft X-Ray Emission Spectroscopy
Department of Physics, Uppsala University.ORCID iD: 0000-0002-0317-0190
2006 (English)In: Mechanical Properties and Performance of Engineering Ceramics II: Ceramic Engineering and Science Proceedings, Volume 7, Issue 2 / [ed] Rajan Tandon, Andrew Wereszczak, Edgar Lara-Curzio, 2006, 325-329 p.Conference paper, Published paper (Refereed)
Abstract [en]

The electronic structures of the MAX-phases Ti3AlC2, Ti3SiC2 and Ti3GeC2 were investigated by soft X-ray emission spectroscopy. These nanolaminated carbide compounds represent a class of layered materials with a combination of properties from both metals and ceramics. The bulk-sensitive soft X-ray emission technique is shown to be particularly useful for detecting detailed electronic structure information about internal monolayers and interfaces. A weak covalent Ti-Al bond is manifested by a pronounced shoulder in the Ti L-emission of Ti3AlC2. When Al is replaced by Si or Ge, the shoulder disappears. Furthermore, the spectral shapes of Al, Si and Ge in the MAX-phases are strongly modified in comparison to the corresponding pure elements. By varying the constituting elements, a change of the electron population is achieved causing a change of covalent bonding between the laminated layers, which enables control of the macroscopic properties of the material.

Place, publisher, year, edition, pages
2006. 325-329 p.
Keyword [en]
nanolaminated; aluminides; hybridization; bandstructure; parallel
National Category
Condensed Matter Physics
Identifiers
URN: urn:nbn:se:liu:diva-55065DOI: 10.1002/9780470291313.ch31ISBN: 9780470080528 (print)ISBN: 9780470291313 (print)OAI: oai:DiVA.org:liu-55065DiVA: diva2:315279
Available from: 2010-04-28 Created: 2010-04-28 Last updated: 2014-11-20

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Magnuson, Martin

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CiteExportLink to record
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  • apa
  • harvard1
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