Max-Phases Investigated by Soft X-Ray Emission Spectroscopy
2006 (English)In: Mechanical Properties and Performance of Engineering Ceramics II: Ceramic Engineering and Science Proceedings, Volume 7, Issue 2 / [ed] Rajan Tandon, Andrew Wereszczak, Edgar Lara-Curzio, 2006, 325-329 p.Conference paper (Refereed)
The electronic structures of the MAX-phases Ti3AlC2, Ti3SiC2 and Ti3GeC2 were investigated by soft X-ray emission spectroscopy. These nanolaminated carbide compounds represent a class of layered materials with a combination of properties from both metals and ceramics. The bulk-sensitive soft X-ray emission technique is shown to be particularly useful for detecting detailed electronic structure information about internal monolayers and interfaces. A weak covalent Ti-Al bond is manifested by a pronounced shoulder in the Ti L-emission of Ti3AlC2. When Al is replaced by Si or Ge, the shoulder disappears. Furthermore, the spectral shapes of Al, Si and Ge in the MAX-phases are strongly modified in comparison to the corresponding pure elements. By varying the constituting elements, a change of the electron population is achieved causing a change of covalent bonding between the laminated layers, which enables control of the macroscopic properties of the material.
Place, publisher, year, edition, pages
2006. 325-329 p.
nanolaminated; aluminides; hybridization; bandstructure; parallel
Condensed Matter Physics
IdentifiersURN: urn:nbn:se:liu:diva-55065DOI: 10.1002/9780470291313.ch31ISBN: 9780470080528ISBN: 9780470291313OAI: oai:DiVA.org:liu-55065DiVA: diva2:315279