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Investigation of Ti2AlC and TiC by soft x-ray emission spectroscopy
Uppsala University.ORCID iD: 0000-0002-0317-0190
2007 (English)In: Journal of Physics: Conference Series 61 / [ed] Ernst Meyer, Martin Hegner, Christoph Gerber and Hans-Joachim Güntherodt, 2007, 760-764 p.Conference paper, Published paper (Refereed)
Abstract [en]

The electronic structure of the MAX-phase Ti pectroscopy. This nanolaminated carbide compound represents a class of layered materials with a combination of properties from both metals and ceramics. The bulk-sensitive soft x-ray emission technique is shown to be particularly useful for detecting detailed electronic structure information about internal monolayers and interfaces. The Ti-Al bonding is manifested by a pronounced peak in the Ti present in the binary TiC system. The spectral shape of Al in comparison to metallic Al. By replacing the constituting elements, a change of the electron population can be achieved causing a change of covalent bonding between the laminated layers, which enables control of the macroscopic properties of the material. 

Place, publisher, year, edition, pages
2007. 760-764 p.
Series
Journal of Physics: Conference Series 61 (2007) 760–764
National Category
Natural Sciences
Identifiers
URN: urn:nbn:se:liu:diva-55067DOI: 10.1088/1742-6596/61/1/152OAI: oai:DiVA.org:liu-55067DiVA: diva2:315282
Conference
International Conference on Nanoscience and Technology (ICN&T 2006), July 30th-August 4th, Basel, Switzerland
Available from: 2010-04-28 Created: 2010-04-28 Last updated: 2014-11-20Bibliographically approved

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Magnuson, Martin

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CiteExportLink to record
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Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
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  • Other style
More styles
Language
  • de-DE
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  • en-US
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Output format
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