Investigation of Ti2AlC and TiC by soft x-ray emission spectroscopy
2007 (English)In: Journal of Physics: Conference Series 61 / [ed] Ernst Meyer, Martin Hegner, Christoph Gerber and Hans-Joachim Güntherodt, 2007, 760-764 p.Conference paper (Refereed)
The electronic structure of the MAX-phase Ti pectroscopy. This nanolaminated carbide compound represents a class of layered materials with a combination of properties from both metals and ceramics. The bulk-sensitive soft x-ray emission technique is shown to be particularly useful for detecting detailed electronic structure information about internal monolayers and interfaces. The Ti-Al bonding is manifested by a pronounced peak in the Ti present in the binary TiC system. The spectral shape of Al in comparison to metallic Al. By replacing the constituting elements, a change of the electron population can be achieved causing a change of covalent bonding between the laminated layers, which enables control of the macroscopic properties of the material.
Place, publisher, year, edition, pages
2007. 760-764 p.
, Journal of Physics: Conference Series 61 (2007) 760–764
IdentifiersURN: urn:nbn:se:liu:diva-55067DOI: 10.1088/1742-6596/61/1/152OAI: oai:DiVA.org:liu-55067DiVA: diva2:315282
International Conference on Nanoscience and Technology (ICN&T 2006), July 30th-August 4th, Basel, Switzerland