Characterization of the Ni/V(TCNE)x interface for hybrid spintronics applications
2010 (English)In: Organic electronics, ISSN 1566-1199, Vol. 11, no 6, 1020-1024 p.Article in journal (Refereed) Published
Vanadium tetracyanoethylene, V(TCNE)x, is an organic-based magnet with properties suitable for spintronics applications, e.g. spin valves. In this paper we propose a new hybrid organic spin valve design where V(TCNE)x is used as a spin-transporting and spin-filtering layer sandwiched between two ferromagnetic (FM) metal contacts, i.e. FM/V(TCNE)x/FM. As the spin injection and detection of such a device occurs at the interfaces the quality of those are of crucial importance. Therefore, the Ni/V(TCNE)x interface has been investigated by X-ray photoelectron spectroscopy (XPS) and near edge X-ray absorption spectroscopy (NEXAFS) as well as compared with XPS results from a model system, Ni/TCNE. Ni chemically interact with both the vinyl and cyano groups but there is no evidence for significant diffusion of Ni into the V(TCNE)x film. As the chemical interaction affects the spin injection and detection negatively by modifying the lowest unoccupied molecular orbital (LUMO) and destroying the magnetic ordering network at the surface, these results indicate that there is need for a buffer layer between V(TCNE)x and Ni, and in extension most likely between V(TCNE)x and any FM contact.
Place, publisher, year, edition, pages
2010. Vol. 11, no 6, 1020-1024 p.
Organic-based molecular magnets; Spintronics; Interfaces; Photoelectron spectroscopy; Magnetic semiconductors
National CategoryNatural Sciences
IdentifiersURN: urn:nbn:se:liu:diva-56259DOI: 10.1016/j.orgel.2010.03.001ISI: 000277935200008OAI: oai:DiVA.org:liu-56259DiVA: diva2:317829
Original Publication: Elin Carlegrim, Yiqiang Zhan, Fenghong Li, Xianjie Liu and Mats Fahlman, Characterization of the Ni/V(TCNE)x interface for hybrid spintronics applications, 2010, Organic electronics, (11), 6, 1020-1024. http://dx.doi.org/10.1016/j.orgel.2010.03.001 Copyright: Elsevier Science B.V., Amsterdam. http://www.elsevier.com/2010-05-052010-05-052015-05-13