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Placement of measurement points for wear-out prediction with regard to electromigration
Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory.
2010 (English)Independent thesis Advanced level (degree of Master (Two Years)), 30 credits / 45 HE creditsStudent thesis
Abstract [en]

Nowadays, electronic systems are widely used in applications such as mobile phones, laptops, etc., but the electronic systems are not permanent and indestructible, so the reliability of an electronic system is a major concern. However, the lifetime of electronic systems are shorter than it was 40 years ago because the dimensions of wires are smaller due to the advanced manufacturing technologies.

 

Electromigration is a wear-out mechanism which becomes an important issue, due to the fact that the reduced dimension of wires makes current density increase so that, the probability of failure due to electromigration is much higher than 40 years ago. Electromigration means the cross-section area of the wire decreases due to the movement of ions in high current density. The reduced cross-section area increases the resistance of the wire so that the delay of the wire is increasing as well. The whole system might fail when the delay is longer than the clock period.

 

To predict electronic system failure caused by electromigration, a delay measurement circuit can be used as a predictor to give an early warning. However, the delay measurement circuit is expensive and not necessary for an electronic system to work correctly. Therefore, the purpose in this thesis is to minimize the number of measurement points. In order to minimize the number of measurement points, a method is developed to find the wear-out sensitive wires (WSWs) and determine where delay measurement circuits should be placed. Therefore, the measurement points are minimized and the cost of the system is also reduced.

Place, publisher, year, edition, pages
2010. , 40 p.
National Category
Computer Science
Identifiers
URN: urn:nbn:se:liu:diva-57751ISRN: LIU-IDA/LITH-EX-A--10/033--SEOAI: oai:DiVA.org:liu-57751DiVA: diva2:327713
Presentation
2010-06-24, Donald Knuth, Linköpings universitet SE-581 83, Linköping, Sweden, 10:15 (English)
Uppsok
Technology
Supervisors
Examiners
Available from: 2010-06-30 Created: 2010-06-30 Last updated: 2011-03-24Bibliographically approved

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Placement of measurement points for wear-out prediction with regard to electromigration(438 kB)207 downloads
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ESLAB - Embedded Systems Laboratory
Computer Science

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CiteExportLink to record
Permanent link

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Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
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  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
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  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
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  • asciidoc
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