Excess low frequency noise in single-wall carbon nanotube
2006 (English)In: Fluctuation and Noise Letters, ISSN 0219-4775, E-ISSN 1793-6780, Vol. 6, no 1, L45-L55 p.Article in journal (Refereed) Published
Low frequency noise measurements have been performed on a single-wall carbon nanotube connected by Ti/Au electrodes. It has been found that the 1/f noise decreases when the measurements are undertaken under vacuum and when the nanotube is partially degassed, showing a correlation between the fluctuation inducing the 1/f noise and the presence of gases. We show that the 1/f noise sources are located at the metal/nanotube contacts. When the device is annealed under vacuum at 450K, some Lorentzian shapes are observable and can be related to nanotube defects or to strongly bound molecules.
Place, publisher, year, edition, pages
WORLD SCIENTIFIC PUBL CO PTE LTD , 2006. Vol. 6, no 1, L45-L55 p.
nanombe; 1/f noise; RTS
Engineering and Technology
IdentifiersURN: urn:nbn:se:liu:diva-59228DOI: 10.1142/S0219477506003136ISI: 000235813200006OAI: oai:DiVA.org:liu-59228DiVA: diva2:350088