liu.seSearch for publications in DiVA
Change search
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • oxford
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
Atomic force microscope current-imaging study for current density through nanocrystalline silicon dots embedded in SiO2
Tokyo Institute of Technolog.
Tokyo Institute of Technolog.
Tokyo Institute of Technolog.
University of Goteborg and Chalmers University of Technology.
Show others and affiliations
2005 (English)In: Japanese Journal of Applied Physics, ISSN 0021-4922, E-ISSN 1347-4065, Vol. 44, no 07-Jan, L88-L91 p.Article in journal (Refereed) Published
Abstract [en]

Simultaneous surface and current imaging through nanocrystalline silicon (nc-Si) dots embedded in SiO2 was achieved using a contact mode atomic force microscope (AFM) under a tip-to-sample bias voltages of about 5 V. The obtained images were then analyzed using a one-dimensional model of current density, which took account of the spherical shape of the nc-Si dots, the substrate orientation and the sample bias. A comparison between the experimental and theoretical results showed a fair agreement when the current pass through the dot center, although a large difference was found at a higher voltage. In addition, our model predicted tunneling current oscillations due to a change in tip position relative to the dot center.

Place, publisher, year, edition, pages
Japan Society of Applied Physics / Japanese Journal of Applied Physics; 1999 , 2005. Vol. 44, no 07-Jan, L88-L91 p.
Keyword [en]
silicon quantum dot; atomic force microscope; current imaging; current density
National Category
Engineering and Technology
Identifiers
URN: urn:nbn:se:liu:diva-59217DOI: 10.1143/JJAP.44.L88ISI: 000227675600029OAI: oai:DiVA.org:liu-59217DiVA: diva2:350103
Available from: 2010-09-10 Created: 2010-09-09 Last updated: 2017-12-12

Open Access in DiVA

No full text

Other links

Publisher's full text

Authority records BETA

Willander, Magnus

Search in DiVA

By author/editor
Willander, Magnus
In the same journal
Japanese Journal of Applied Physics
Engineering and Technology

Search outside of DiVA

GoogleGoogle Scholar

doi
urn-nbn

Altmetric score

doi
urn-nbn
Total: 66 hits
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • oxford
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf