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Ultrathin oxynitridation process through ion implantation in a poly Si1-xGex gate MOS capacitor
Chalmers.
Chalmers.
Chalmers.
Chalmers.
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2003 (English)In: Materials Science in Semiconductor Processing, ISSN 1369-8001, E-ISSN 1873-4081, Vol. 6, no 03-Jan, 37-41 p.Article in journal (Refereed) Published
Abstract [en]

Effect of temperature and time of heat treatment on the distribution of ion-implanted nitrogen in poly Si0.65Ge0.35 gate MOS samples was studied. Secondary ion mass spectrometry (SIMS) was used for the qualitative analysis of the nitrogen distribution. Rapid thermal processing was carried out for a temperature range of 950-1070degreesC for the redistribution of ions. The nitrogen implantation doses were 5 x 10(14) cm(-2), 2 x 10(15) cm(-2) and 5 x 10(15) cm(-2), all with an implantation energy of 50 keV. For a uniform distribution of nitrogen in the SiO2 region, an optimal temperature at a well calibrated time must be applied and this depends on the implantation dose. For medium and high concentrations the optimal conditions were 1050degreesC and 15s, and 1070degreesC and 15s, respectively. A uniform nitrogen distribution could be obtained throughout the SiO2 film. Prolonged heat treatment can cause degradation of the oxide layer and movement of the nitrogen and oxygen into the channel and the poly-Si0.65Ge0.35 layer.

Place, publisher, year, edition, pages
Elsevier Science B.V., Amsterdam. , 2003. Vol. 6, no 03-Jan, 37-41 p.
Keyword [en]
nitrogen implantation; SIMS
National Category
Engineering and Technology
Identifiers
URN: urn:nbn:se:liu:diva-59193DOI: 10.1016/S1369-8001(03)00069-6ISI: 000185052200005OAI: oai:DiVA.org:liu-59193DiVA: diva2:350137
Available from: 2010-09-10 Created: 2010-09-09 Last updated: 2017-12-12

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Nour, OmerWillander, Magnus

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