Residual stress evolution during decomposition of Ti((1-x))Al((x))N coatings using high-energy x-rays
2006 (English)In: Materials Science Forum, ISSN 0255-5476, Vol. 524-525, 619-624 p.Article in journal (Refereed) Published
Residual stresses and microstructural changes during phase separation in Ti33Al67N coatings were examined using microfocused high energy x-rays from a synchrotron source. The transmission geometry allowed simultaneous acquisition of x-ray diffraction data over 360 degrees and revealed that the decomposition at elevated temperatures occurred anisotropically, initiating preferentially along the film plane. The as-deposited compressive residual stress in the film plane first relaxed with annealing, before dramatically increasing concurrently with the initial stage of phase separation where metastable, nm-scale c-AlN platelets precipitated along the film direction. These findings were further supported from SAXS analyses.
Place, publisher, year, edition, pages
Transtec Publications; 1999 , 2006. Vol. 524-525, 619-624 p.
ceramic coatings; TiAlN; WAXS; SAXS; x-ray scattering; small-angle x-ray scattering; synchrotron radiation; x-ray diffraction
Engineering and Technology
IdentifiersURN: urn:nbn:se:liu:diva-59143DOI: 10.4028/www.scientific.net/MSF.524-525.619ISI: 000241187200096OAI: oai:DiVA.org:liu-59143DiVA: diva2:350221