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Deterministic Scan-Chain Diagnosis for Intermittent Faults
NXP Semiconductors corp., Eindhoven, the Netherlands.
Philips Applied Technologies, Eindhoven, the Netherlands.
Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory. Linköping University, The Institute of Technology.
IMEC, Leuven, Belgium).
2009 (English)In: European Test Symposium (ETS 2009), Sevilla, Spain, May 25-29, 2009 (Poster)., 2009Conference paper (Other academic)
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Engineering and Technology
URN: urn:nbn:se:liu:diva-59589OAI: diva2:352611
Available from: 2010-09-21 Created: 2010-09-21 Last updated: 2010-09-30

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Larsson, Erik
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ESLAB - Embedded Systems LaboratoryThe Institute of Technology
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