On Minimization of Peak Power for Scan Circuit during Test
2009 (English)In: Proceedings of the 14th IEEE European Test Symposium, ETS 2009, 2009, 25-30 p.Conference paper (Refereed)
Scan circuit generally causes excessive switching activity compared to normal circuit operation. The higher switching activity in turn causes higher peak power supply current which results into supply voltage droop and eventually yield loss. This paper proposes an efficient methodology for test vector re-ordering to achieve minimum peak power supported by the given test vector set. The proposed methodology also minimizes average power under the minimum peak power constraint. A methodology to further reduce the peak power, below the minimum supported peak power, by inclusion of minimum additional vectors is also discussed. The paper defines the lower bound on peak power for a given test set. The results on several benchmarks shows that it can reduce peak power by up to 27%.
Place, publisher, year, edition, pages
2009. 25-30 p.
Engineering and Technology
IdentifiersURN: urn:nbn:se:liu:diva-59591DOI: 10.1109/ETS.2009.36ISBN: 978-0-7695-3703-0OAI: oai:DiVA.org:liu-59591DiVA: diva2:352613
14th IEEE European Test Symposium, ETS 2009; Sevilla; Spain
©2010 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. Jaynarayan T. Tudu, Erik Larsson, Virendra Singh and Vishwani Agrawal, On Minimization of Peak Power for Scan Circuit during Test, 2009, European Test Symposium (ETS 2009), Sevilla, Spain, May 25-29, 2009, 25-30.2010-09-292010-09-212014-09-05Bibliographically approved