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Efficient Embedding of Deterministic Test Data
Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory. Linköping University, The Institute of Technology.
Linköping University, Department of Computer and Information Science. Linköping University, The Institute of Technology.
Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory. Linköping University, The Institute of Technology.
Ericsson AB BU Networks, Stockholm, Sweden.
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2010 (English)In: 19th IEEE Asian Test Symposium (ATS10), Shanghai, China, December 1-4, 2010., 2010, 159-162 p.Conference paper, Published paper (Refereed)
Abstract [en]

Systems with many integrated circuits (ICs), often of the same type, are increasingly common to meet the constant performance demand. However, systems in recent semiconductor technologies require not only manufacturing test, but also in-field test. Preferably, the same test set is utilized both at manufacturing test and in-field test. While deterministic test patterns provide high fault coverage, storing complete test vectors leads to huge memory requirements and inflexibility in applying tests. In an IEEE 1149.1 (Boundary scan) environment, this paper presents an approach to efficiently embed deterministic test patterns in the system by taking structural information of the system into account. Instead of storing complete test vectors, the approach stores only commands and component-specific test sets per each unique component. Given a command, test vectors are created by a test controller during test application. The approach is validated on hardware and experiments on ITC’02 benchmarks and industrial circuits show that the memory requirement for storing the test data for a system is highly related to the number of unique components.

Place, publisher, year, edition, pages
2010. 159-162 p.
Series
Test Symposium (ATS), ISSN 1081-7735, E-ISSN 2377-5386
National Category
Engineering and Technology
Identifiers
URN: urn:nbn:se:liu:diva-59596DOI: 10.1109/ATS.2010.36ISBN: 978-1-4244-8841-4 (print)ISBN: 978-0-7695-4248-5 (electronic)OAI: oai:DiVA.org:liu-59596DiVA: diva2:352619
Available from: 2010-09-21 Created: 2010-09-21 Last updated: 2017-01-23

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Majeed, MudassarAhlström, DanielIngelsson, UrbanLarsson, Erik

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ESLAB - Embedded Systems LaboratoryThe Institute of TechnologyDepartment of Computer and Information Science
Engineering and Technology

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CiteExportLink to record
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Citation style
  • apa
  • harvard1
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  • de-DE
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