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Checking Pipelined Distributed Global Properties for Post-silicon Debug
Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory. Linköping University, The Institute of Technology.
NXP Semiconductors, Netherlands.
Eindhoven University of Technology, Netherlands.
2010 (English)In: Workshop on RTL ATPG & DFT (WRTLT10), Shanghai, China, December 2010., 2010Conference paper, Published paper (Refereed)
Place, publisher, year, edition, pages
2010.
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Engineering and Technology
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URN: urn:nbn:se:liu:diva-59599OAI: oai:DiVA.org:liu-59599DiVA: diva2:352623
Available from: 2010-09-21 Created: 2010-09-21 Last updated: 2010-09-28

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Larsson, Erik

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ESLAB - Embedded Systems LaboratoryThe Institute of Technology
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CiteExportLink to record
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Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
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  • Other style
More styles
Language
  • de-DE
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  • nn-NB
  • sv-SE
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Output format
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